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The following article appeared in Appl. Phys. Lett. 86, 152902 (2005) and may also be found at .

S. Sayan, N.V. Nguyen, J. Ehrstein, T. Emge, E. Garfunkel, M. Croft, Xinyuan Zhao, David Vanderbilt, I. Levin, E.P. Gusev, Hyoungsub Kim, and P.J. McIntyre, Structural, electronic and dielectric properties of ultrathin zirconia films on silicon (in PDF format).

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